Fig. 2

Evaluation of the growth capacity of yeast strains engineered with Weimberg pathway genes. The dot plating tests were done in defined agar-medium supplemented with d-glucose, d-xylose or a mixture of d-glucose and d-xylose. The background strain CEN.PK 113-7D was used as negative control for growth on d-xylose (first row). As a positive control for growth on d-xylose, a strain engineered with an optimized d-xylose oxido-reduction route (TMB4545) was used (last row)